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Fringe pattern analysis based on the two-dimensional synchrosqueezing transform.

Tsubasa Kusano, Kohei Yatabe, Yasuhiro Oikawa

    Optics Letters
    |July 15, 2024
    PubMed
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    The two-dimensional synchrosqueezing transform (SST) enhances fringe pattern analysis by overcoming limitations of the Windowed Fourier Transform (WFT). This method improves denoising and local frequency estimation in optical measurements.

    Area of Science:

    • Optical Metrology
    • Signal Processing
    • Image Analysis

    Background:

    • Windowed Fourier Transform (WFT) is a standard technique for analyzing fringe patterns in optical measurements.
    • The WFT's inherent limitation in space-frequency resolution can hinder accurate analysis.
    • This limitation impacts the performance in applications requiring precise fringe pattern interpretation.

    Purpose of the Study:

    • To introduce and evaluate the two-dimensional synchrosqueezing transform (SST) for fringe pattern analysis.
    • To address the space-frequency resolution limitations of the WFT.
    • To demonstrate the effectiveness of SST in improving the analysis of optical fringe patterns.

    Main Methods:

    • Application of the two-dimensional synchrosqueezing transform (SST) to fringe pattern analysis.

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  • Utilizing the derivative of the WFT phase to sharpen the WFT representation.
  • Conducting numerical experiments to validate the proposed method.
  • Main Results:

    • The SST effectively sharpens the WFT representation of fringe patterns.
    • Numerical experiments confirmed the SST's capability in denoising fringe patterns.
    • The SST demonstrated improved accuracy in estimating local frequencies from observed fringe patterns.

    Conclusions:

    • The two-dimensional synchrosqueezing transform (SST) offers a significant advancement for fringe pattern analysis.
    • SST overcomes the resolution limitations of the WFT, leading to enhanced performance.
    • The method shows promise for improving the reliability and accuracy of optical measurement techniques.