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Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Related Experiment Video

Updated: Jun 20, 2025

High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
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High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip

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An integrated atom array-nanophotonic chip platform with background-free imaging.

Shankar G Menon1, Noah Glachman1, Matteo Pompili1

  • 1Pritzker School of Molecular Engineering, University of Chicago, Chicago, IL, 60637, USA.

Nature Communications
|July 22, 2024
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Summary
This summary is machine-generated.

We developed a new method for imaging neutral atom arrays near photonic chips, achieving high-fidelity detection for quantum information processing. This breakthrough enables scalable quantum networks by integrating atom qubits with photonic interfaces.

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Area of Science:

  • Quantum Information Science
  • Atomic Physics
  • Nanophotonics

Background:

  • Neutral atom arrays in optical tweezers are scalable platforms for quantum information processing and simulation.
  • Individual atoms can be used for quantum networking by emitting entangled photons.
  • Integrating atom arrays with photonic interfaces is challenging due to imaging difficulties near photonic devices.

Purpose of the Study:

  • To demonstrate a novel architecture for integrating neutral atom arrays with photonic chips.
  • To overcome the challenge of background noise and scattering from photonic devices during atom imaging.
  • To enable the development of distributed quantum computing architectures.

Main Methods:

  • Utilized an architecture combining up to 64 optical tweezers with a millimeter-scale photonic chip containing over 100 nanophotonic cavities.
  • Implemented a multichromatic excitation and detection scheme for high-fidelity, background-free imaging.
  • Verified atom trapping positions near the dielectric surface using Stark shift measurements.

Main Results:

  • Achieved high-fidelity (~99.2%) background-free imaging of neutral atoms near nanophotonic cavities.
  • Demonstrated successful imaging of atoms trapped a few hundred nanometers above the photonic chip surface.
  • Successfully rearranged atoms into defect-free arrays and loaded them onto devices.

Conclusions:

  • The developed architecture successfully integrates neutral atom arrays with photonic interfaces.
  • The multichromatic imaging technique overcomes previous limitations in atom detection near photonic devices.
  • This work paves the way for scalable, distributed quantum information processing and quantum networking.