You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 18, 2025

Microfluidic Platform with Multiplexed Electronic Detection for Spatial Tracking of Particles
Published on: March 13, 2017
Weixun Chen1,2, Siming Meng1,2, Xueping Wang3
1The Information Engineering Institute, Guangzhou Railway Polytechnic, Guangzhou 510430, China.
This study introduces LGCL-CenterNet, a lightweight model for real-time printed circuit board (PCB) surface defect detection. It enhances accuracy and speed by combining local and global context features, improving manufacturing quality.
11:14Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
10:42In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM
Published on: June 16, 2016
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: