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Optimizing Ti/TiN Multilayers for UV, Optical and Near-IR Microwave Kinetic Inductance Detectors.

Gerhard Ulbricht^1,2,3, Mario De Lucia^1,2, Jack Piercy^1,2

¹Dublin Institute for Advanced Studies, 31 Fitzwilliam Place, Dublin 02, Ireland.

Journal of Low Temperature Physics

|July 29, 2024

Summary

This summary is machine-generated.

Researchers are developing advanced Microwave Kinetic Inductance Detectors (MKIDs) using titanium/titanium nitride (Ti/TiN) films for improved UV, visible, and near-IR photon detection. While initial prototypes show promise, further optimization is needed to enhance sensitivity.

Keywords:

Detector fabrication Kinetic inductance detectors UVOIR MKIDs

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Fabrication and Characterization of Superconducting Resonators

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Area of Science:

Superconducting devices
Photon detection technologies
Materials science for detectors

Background:

Microwave Kinetic Inductance Detectors (MKIDs) offer advantages like single photon counting and high time resolution.
Fabricating high-quality MKIDs is challenging due to material limitations and operating temperature requirements.
Titanium/titanium nitride (Ti/TiN) multilayers present a promising alternative for various MKID applications.

Purpose of the Study:

To adapt proximity-coupled superconducting Ti/TiN films for photon-counting MKIDs.
To investigate the fabrication of Ti/TiN multilayers for UV, visible, and near-IR detection.
To address challenges in MKID performance and explore potential improvements.

Main Methods:

Fabrication of alternating Ti/TiN thin film stacks.
Investigating the effect of fabrication temperatures on detector performance.
Characterizing detector sensitivity and photon energy resolving power.

Main Results:

Ti/TiN multilayers demonstrate controllable critical temperature (Tc) and good homogeneity over large wafers.
First prototypes achieved a photon energy resolving power of up to 3.1.
Initial prototypes were found to be insufficiently sensitive, with excess phase noise attributed to silicon surface oxidation.

Conclusions:

Ti/TiN multilayers are a viable and controllable material system for fabricating MKIDs.
Further optimization is required to overcome sensitivity limitations and mitigate noise sources.
Ongoing research focuses on improving detector performance for future applications in UV, visible, and near-IR photon detection.