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Updated: Jun 18, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Towards large-scale single-shot millimeter-wave imaging for low-cost security inspection
Liheng Bian1,2, Daoyu Li3, Shuoguang Wang4,5
1State Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing, Beijing Institute of Technology, 100081, Beijing, China. bian@bit.edu.cn.
Abstract:
Millimeter-Wave (MMW) imaging is a promising technique for contactless security inspection. However, the high cost of requisite large-scale antenna arrays hinders its widespread application in high-throughput scenarios. Here, we report a large-scale single-shot MMW imaging framework, achieving low-cost high-fidelity security inspection. We first analyzed the statistical ranking of each array element through 1934 full-sampled MMW echoes. The highest-ranked elements are preferentially selected based on the ranking, building the experimentally optimal sparse sampling strategy that reduces antenna array cost by one order of magnitude. Additionally, we derived an untrained interpretable learning scheme, realizing robust and accurate MMW image reconstruction from sparsely sampled echoes. Last, we developed a neural network for automatic object detection, and experimentally demonstrated successful detection of concealed centimeter-sized targets using 10% sparse array, whereas all the other contemporary approaches failed at such a low sampling ratio. With the strong detection ability and order-of-magnitude cost reduction, we anticipate that this technique provides a practical way for large-scale single-shot MMW imaging.

