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A p-n junction is formed when p-type and n-type semiconductor materials are joined together. At the interface of the p-n junction, holes from the p-side and electrons from the n-side begin to diffuse into the opposite sides due to the concentration gradient. This diffusion of carriers leads to a region around the junction where there are no free charge carriers, known as the depletion region. The charge density within the depletion region for the n-side and p-side can be described by the...

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Updated: Jun 18, 2025

Flash Infrared Annealing for Perovskite Solar Cell Processing

Flash Infrared Annealing for Perovskite Solar Cell Processing

Published on: February 3, 2021

NiO Passivation in Perovskite Solar Cells: From Surface Reactivity to Device Performance.

John Mohanraj¹, Bipasa Samanta², Osbel Almora^3,4

¹Department of Chemistry, University of Cologne, Greinstrasse 4-6, Cologne 50939, Germany.

ACS Applied Materials & Interfaces

|August 1, 2024

Summary

Interface passivation of nickel oxide (NiO) in perovskite solar cells (PSCs) improves structural stability but can lead to ion accumulation, reducing operational stability. Understanding this trade-off is key for advancing PSC technology.

Keywords:

NiOx X-ray photoelectron spectroscopy density functional theory halide perovskite impedance spectroscopy interface solar cell stability

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Published on: September 8, 2017

Area of Science:

Materials Science
Renewable Energy
Photovoltaics

Background:

Nonstoichiometric nickel oxide (NiO) is a promising hole extraction layer for perovskite solar cells (PSCs).
Direct contact between NiO and perovskite absorbers leads to degradation and low operational stability in PSCs.
Interface passivation strategies are crucial for enhancing PSC performance and longevity.

Purpose of the Study:

To systematically investigate the effects of passivating NiO surface defects on perovskite film formation and PSC stability.
To elucidate the degradation mechanisms at the NiO-perovskite interface using experimental and computational methods.
To correlate interface structural improvements with device performance and operational stability.

Main Methods:

Surface passivation of NiO with organic/inorganic compounds.
Characterization using X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), and scanning electron microscopy (SEM).
Device fabrication and performance evaluation via current-voltage (J-V) measurements, impedance spectroscopy (IS), and open circuit voltage decay (OCVD).

Main Results:

Perovskite structural stability and film formation are significantly influenced by NiO surface passivation.
Density functional theory (DFT) calculations suggest a likely origin for NiO-perovskite degradation interactions.
Passivation enhances structural stability but does not guarantee improved operational stability due to excess ion formation.

Conclusions:

Interface passivation of NiO in PSCs presents a complex trade-off between structural integrity and operational stability.
Excess ion formation at the passivated interface negatively impacts overall solar cell performance.
Further research is needed to optimize passivation strategies that mitigate ion migration for long-term PSC stability.