Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Standardized contrast-enhanced CT-based radiomics for non-invasive prediction of TTF-1 status in lung adenocarcinoma: A cross-validated single-center study.

European journal of radiology open·2026

Same author

Step-Edge Functionalization by N-Heterocyclic Carbenes Enhances Catalytic Activity in Electrochemical CO<sub>2</sub> Reduction.

Advanced materials (Deerfield Beach, Fla.)·2026

Same author

Subtype-specific prognostic impact of TNIK in medulloblastoma.

Journal of neuro-oncology·2026

Same author

Host-Atom-Driven Transformation of a Honeycomb Oxide into a Dodecagonal Quasicrystal.

Physical review letters·2026

Same author

A Free N-Heterocyclic Carbene and Its Metal Complex.

Angewandte Chemie (International ed. in English)·2026

Same author

CD70/CD27 signaling promotes the pathogenesis of multiple myeloma and represents a promising therapeutic target.

Leukemia·2026

Search research articles

Related Experiment Video

Updated: Jun 17, 2025

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Standardization of Chemically Selective Atomic Force Microscopy for Metal Oxide Surfaces.

Philipp Wiesener^1,2, Stefan Förster³, Milena Merkel^1,2

¹Universität Münster, Physikalisches Institut, Münster 48149, Germany.

|August 5, 2024

Summary

This study introduces a new atomic force microscopy method using oxygen-terminated copper tips. It provides direct chemical contrast and defect imaging for metal oxide surfaces, simplifying materials characterization.

Keywords:

chemical imaging defect characterization metal oxide surfaces noncontact atomic force microscopy (nc-AFM)oxygen-terminated copper tip (CuOx-tip)probe-tip functionalization

More Related Videos

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Related Experiment Videos

Last Updated: Jun 17, 2025

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Experimental Multiscale Methodology for Predicting Material Fouling Resistance

Area of Science:

Materials Science
Surface Chemistry
Nanotechnology

Background:

Characterizing metal oxide surfaces and defects is crucial for materials science and chemistry.
Current methods like scanning probe microscopy often require indirect assumptions and theoretical modeling for elemental discrimination.

Purpose of the Study:

To develop a standardized methodology for direct atomic-scale characterization of metal oxide surfaces.
To enable immediate access to the atomic configuration of defects with chemical contrast.

Main Methods:

Utilized atomic force microscopy (AFM) with oxygen-terminated copper tips.
Applied the technique to various metal oxide sample systems.

Main Results:

Demonstrated clear and universal chemical contrast on metal oxide surfaces.
Achieved direct imaging of defect atomic configurations.
Explained the contrast mechanism through electrostatic interactions between the tip and surface potentials.

Conclusions:

The developed AFM method offers a standardized approach for direct characterization of complex metal oxide surfaces.
Provides fundamental insights into atomic-scale processes on these materials.
Overcomes limitations of indirect elemental discrimination in surface analysis.