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Published on: July 27, 2018
Development of an Ion Mobility Spectrometer Based on a Pulsed Photoelectric Effect Ionization Source
Tianyun Wu1, Yan Wang2, Wenhui Li1
1School of Electronic and Information Engineering, Soochow University, Suzhou, 215006, China.
A novel gateless ion mobility spectrometry (IMS) uses a pulsed photoelectric effect ionization source. This method simplifies instrument design and enhances ion packet generation for improved trace gas analysis.
Area of Science:
- Analytical Chemistry
- Spectroscopy
- Instrumentation
Background:
- Ion mobility spectrometry (IMS) is a sensitive technique for trace gas analysis.
- Conventional IMS often relies on complex ion gates, limiting performance.
- Gateless IMS offers a simpler alternative for ion packet generation and detection.
Purpose of the Study:
- To design and evaluate a novel gateless IMS system.
- To utilize a pulsed photoelectric effect ionization source for ion generation.
- To improve ion packet formation and enhance IMS performance.
Main Methods:
- Development of an IMS system with a pulsed photoelectric effect ionization source.
- Generation of photoelectrons using a pulsed xenon lamp and photoelectric material.
- Application of a pulsed electric field to enhance resolving power.
Main Results:
- The pulsed photoelectric ionization source produced photoelectron currents in the microampere range, yielding ion signals over 10 nA.
- Separate ion packets were generated without an ion gate.
- Resolving power was improved by 1.85 times with an assisted pulsed electric field.
- Detection of volatile hazardous chemicals, including phenol, with a detection limit below 1 ppb.
Conclusions:
- The developed gateless IMS with a pulsed photoelectric ionization source is effective for trace gas analysis.
- The system demonstrates potential for detecting substances with high electron affinity, such as explosives.
- This approach offers a simplified and potentially more efficient alternative to conventional IMS.
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