Rapid detection of rare events from in situX-ray diffraction data using machine learning.

Weijian Zheng1, Jun-Sang Park1, Peter Kenesei1

  • 1Argonne National Laboratory, Lemont, IL60439, USA.

Journal of Applied Crystallography
|August 7, 2024
PubMed
Summary

A new automated technique rapidly detects plasticity onset in high-energy X-ray microscopy data. This method accelerates analysis by over 50 times, even with sparser datasets, enabling faster materials science insights.