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Updated: Jul 18, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Correction: First-principles calculations of interfacial thermal transport properties between SiC/Si substrates and

Zhehao Sun1, Kunpeng Yuan1, Xiaoliang Zhang1

  • 1Key Laboratory of Ocean Energy Utilization and Energy Conservation of Ministry of Education, School of Energy and Power Engineering, Dalian University of Technology, Dalian, 116024, China. zhangxiaoliang@dlut.edu.cn.

Physical Chemistry Chemical Physics : PCCP
|August 7, 2024
PubMed

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