FAST-EM array tomography: a workflow for multibeam volume electron microscopy

Arent J Kievits1, B H Peter Duinkerken2, Ryan Lane1

  • 1Department of Imaging Physics, Delft University of Technology, Delft, The Netherlands.

Methods in Microscopy
|August 9, 2024
PubMed
Summary

FAST-EM, a novel multibeam scanning transmission electron microscope, accelerates 3D nanoscale imaging of biological samples. This new workflow enables high-resolution, large-volume ultrastructural data acquisition within practical timeframes.