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Hybridization of Atomic Orbitals I
Van der Waals Equation
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Updated: Jun 17, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
I R Best1, T J Sullivan1,2, J R Kermode1
1Warwick Centre for Predictive Modelling, School of Engineering, University of Warwick, Coventry CV4 7AL, United Kingdom.
Quantifying simulation errors is crucial. This study uses conformal prediction with atomic cluster expansion potentials to provide calibrated error bars for silicon properties, improving simulation reliability.
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