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Metric3D v2: A Versatile Monocular Geometric Foundation Model for Zero-Shot Metric Depth and Surface Normal
Metric3D v2, a geometric foundation model, achieves zero-shot metric depth and surface normal estimation from single images. This advances 3D recovery and single-image metrology by resolving scale ambiguity and improving normal prediction accuracy.
Area of Science:
- Computer Vision
- Geometric Deep Learning
- 3D Reconstruction
Background:
- Monocular depth estimation methods often generalize poorly to real-world metric scales.
- Surface normal estimation faces challenges in zero-shot performance due to limited labeled data.
- Accurate 3D recovery from single images requires precise metric depth and surface normal information.
Purpose of the Study:
- To introduce Metric3D v2, a geometric foundation model for zero-shot metric depth and surface normal estimation.
- To address the limitations of existing methods in recovering metric scale and achieving robust zero-shot generalization.
- To enable accurate single-image metrology and improve monocular Simultaneous Localization and Mapping (SLAM).
Main Methods:
- Developed a canonical camera space transformation module to resolve metric ambiguity in depth estimation.
- Introduced a joint depth-normal optimization module leveraging metric depth data to enhance normal estimation.
- Trained the model on over 16 million images from diverse camera models with varied annotations.
Main Results:
- Metric3D v2 achieves state-of-the-art zero-shot generalization to new camera settings.
- The model ranks first in multiple zero-shot and standard benchmarks for metric depth and surface normal prediction.
- Demonstrated accurate metric 3D structure recovery from internet images and reduced scale drift in monocular SLAM.
Conclusions:
- Metric3D v2 serves as a versatile geometric foundation model for single-image 3D recovery.
- The proposed methods significantly improve metric depth and surface normal estimation accuracy in a zero-shot setting.
- The model paves the way for advanced applications in single-image metrology and dense 3D mapping.
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