Complementary Nanoparticle Characterization by Resistive-Pulse Sensing, Electron Microscopy, and Charge Detection...

Area of Science:

• Nanotechnology
• Materials Science
• Analytical Chemistry

Background:

• Nanoparticles (NPs) offer promising applications in drug delivery.
• Accurate characterization of NPs is crucial but challenging.
• Conventional methods like electron microscopy (EM) have limitations.

Purpose of the Study:

• To develop a robust multi-technique approach for comprehensive nanoparticle characterization.
• To accurately determine physical properties like mass and density for silica NPs.
• To assess sample heterogeneity and particle populations.

Main Methods:

• Combined electron microscopy (EM), resistive-pulse sensing (RPS), and charge detection mass spectrometry (CD-MS).
• Analyzed silica nanoparticles (NPs) across various sizes.
• Utilized single-particle techniques for accurate mass and volume determination.

Main Results:

• Accurate volume, mass, and density data were obtained for silica NPs.
• Densities of larger NPs varied, deviating from fused silica, indicating porosity.
• Mass distribution revealed distinct particle populations in heterogeneous samples.

Conclusions:

• The synergistic combination of EM, RPS, and CD-MS provides extensive NP characterization.
• This multi-technique approach overcomes limitations of individual methods.
• Enables deeper insights into NP properties and sample heterogeneity.