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X-Band Single Chip Integrated Pulsed Electron Spin Resonance Microsystem.

Reza Farsi1, Nergiz Sahin Solmaz1, Mattéo Maury1

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We developed a compact, low-power electron spin resonance (ESR) detector on a single chip. This microsystem achieves high spin sensitivity for analyzing small sample volumes, enabling advanced material characterization.

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Area of Science:

  • Microsystems Engineering
  • Magnetic Resonance Spectroscopy
  • Materials Science

Background:

  • Electron spin resonance (ESR) spectroscopy is a powerful technique for probing unpaired electrons.
  • miniaturization of ESR detectors is crucial for analyzing micro- and nano-scale samples.
  • Existing ESR systems often require large footprints and significant power consumption.

Purpose of the Study:

  • To design and characterize a novel single-chip integrated pulsed electron spin resonance detector.
  • To demonstrate the detector's capability in performing various ESR pulse sequences.
  • To evaluate the performance metrics, including spin sensitivity and power consumption.

Main Methods:

  • Integration of key ESR components (microcoils, preamplifier, mixer, IF amplifier) onto a 0.7 mm² chip.
  • Operation at 9.1 GHz with a low noise microwave preamplifier.
  • Performance evaluation using standard ESR pulse sequences (Rabi, Hahn echo, Carr-Purcell) on BDPA samples.

Main Results:

  • Achieved a spin sensitivity of approximately 8 × 10⁷ spins/Hz¹/² within a 0.1 nL sensitive volume.
  • Demonstrated successful execution of multiple pulsed ESR experiments at room temperature.
  • Microsystem exhibits low power consumption (<100 mW), wide RF bandwidth (8.8–9.8 GHz), and short deadtime (<30 ns).

Conclusions:

  • The single-chip integrated ESR detector represents a significant advancement in miniaturized magnetic resonance technology.
  • The demonstrated performance enables sensitive analysis of minute sample volumes.
  • This technology holds promise for diverse applications in materials science and chemical analysis.