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Updated: May 6, 2026

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
Published on: December 27, 2012
Multiwavelength Achromatic Deflector in the Visible Using a Single-Layer Freeform Metasurface
Taewon Choi1, Chulsoo Choi1,2, Junseo Bang1
1Inter-University Semiconductor Research Center, School of Electrical and Computer Engineering, Seoul National University, 1 Gwanakro, Gwanak-Gu, Seoul 08826, Republic of Korea.
Abstract:
Deflectors are essential for modulating beam direction in optical systems but often face form factor issues or chromatic aberration with conventional optical elements, such as prisms, mirrors, and diffractive/holographic optical elements. Despite recent efforts to address such issues using metasurfaces, their practicality remains limited due to operation wavelengths in the near-infrared or the fabrication difficulties inherent in the multilayer scheme. Here, we propose a novel single-layer metasurface achieving multiwavelength chromatic aberration-free deflection across the visible spectrum by employing the robust freeform design strategy to simplify the fabrication process. By properly selecting diffraction orders for red, green, and blue wavelengths to achieve identical wavelength-diffraction-order products, the metasurface deflects light at a consistent angle of 41.3° with a high efficiency. The coupled Bloch mode analysis explains the physical properties, and experimental fabrication and characterization confirm its effectiveness. This approach holds potential for various applications such as AR/VR, digital cameras, and high-quality optical systems.

