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Linear-Structured-Light Measurement System Based on Scheimpflug Camera Thick-Lens Imaging.

Dongyu Guo1, Jiwen Cui1, Yuhang Wu1

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A new thick-lens model improves structured-light measurements by accounting for lens thickness, reducing systematic errors and enhancing 3D coordinate accuracy for Scheimpflug cameras.

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Scheimpflug camerameasurement fieldmeasurement modelsensorstructured light

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Area of Science:

  • Optics
  • Metrology
  • Computer Vision

Background:

  • Traditional Scheimpflug camera models often neglect lens thickness, leading to measurement inaccuracies.
  • This oversight introduces systematic errors and reduces precision in 3D reconstruction.
  • Accurate optical modeling is crucial for reliable structured-light measurement systems.

Purpose of the Study:

  • To introduce a novel thick-lens structured-light measurement model that incorporates lens thickness.
  • To geometrically derive a linear-structured-light model considering principal points and tilted image planes.
  • To reduce systematic errors and improve the accuracy of 3D coordinate calculations.

Main Methods:

  • Developed a thick-lens model based on geometrical optics, including principal points and spatial shifts.
  • Deduced the positional relationship between the thick lens and a tilted optical axis.
  • Utilized simulations and experimental validation to assess model performance.

Main Results:

  • Simulations demonstrated precise 3D coordinate calculation from structured-light data.
  • The model significantly reduced systematic errors across the measurement spectrum.
  • Experimental results showed enhanced accuracy and a lower standard deviation compared to traditional models.

Conclusions:

  • The proposed thick-lens model effectively addresses limitations of traditional thin-lens approaches.
  • This refined sensor model provides more accurate and precise 3D measurements.
  • The model has significant implications for structured-light metrology and optical system design.