The Hall Effect
Non-ohmic Devices
Metal-Semiconductor Junctions
Types of Semiconductors
Biasing of Metal-Semiconductor Junctions
Linear Approximation in Frequency Domain
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Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials
Published on: January 21, 2016
1Department of Physics, the Hong Kong University of Science and Technology, Clear Water Bay, Hong Kong, China. cpzhang@ust.hk.
No abstract available in PubMed .