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Updated: Jun 14, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
A first-principles study of the electronic structure and point defects in higher manganese silicide Mn4Si7
Jun Chai1, Guangshu Li2, Mingping He1
1College of Chemical and Material Engineering, Quzhou University, Quzhou 324000, Zhejiang, China. chaijun@qzc.edu.cn.
Abstract:
Point defects play a crucial role in determining the physical properties of solid-state semiconductor materials. However, theoretical investigations dedicated to point defects in higher manganese silicides (HMSs), promising thermoelectric materials composed of earth-abundant and eco-friendly elements, are surprisingly absent in the literature. Here, using first-principles calculations we systematically investigate the intrinsic and extrinsic point defects in a HMS, Mn4Si7. Our results indicate that the formation energies of intrinsic defects in Mn4Si7 are sufficiently high to preclude their significant concentration under thermal equilibrium growth conditions, and the experimentally observed p-type conductivity of the pure HMS could be a result of self-doping. Additionally, we calculated the defect formation energies of 14 candidate dopants by fully considering the secondary phases, which are in good agreement with experimental findings. Our results provide valuable guidance for optimizing the doping strategy of HMSs for device applications.
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