Change in volatile profiles of wheat flour during maturation

The volatile profiles of wheat flour during maturation were examined through headspace solid-phase micro-extraction gas chromatography-mass spectrometry (HS-SPME-GC/MS) combined with electronic nose (E-nose) and electronic tongue (E-tongue) analyses. The wheat flour underwent maturation under three distinct conditions for predetermined durations. While GC/MS coupled with E-tongue exhibited discernment capability among wheat flour samples subjected to varying maturation conditions, E-nose analysis solely relying on principal component analysis failed to achieve discrimination. 83 volatile compounds were identified in wheat flour, with the highest abundance observed in samples matured for 50 d at 25 °C. Notably, trans-2-Nonenal, decanal, and nonanal were the main contributors to the characteristic flavor profile of wheat flour. Integration of HS-SPME-GC/MS with E-tongue indicated superior flavor development and practical viability in wheat flour matured for 50 d at 25 °C. This study furnishes a theoretical groundwork for enhancing the flavor profiles of wheat flour and its derivative products.