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Updated: Jun 13, 2025

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment
Published on: November 9, 2015
Nano-FTIR spectroscopy reveals SiO2 densification within fs-laser induced nanogratings
Nadezhda Shchedrina1,2, Gergely Nemeth3, Ferenc Borondics3
1Institut de Chimie Moléculaire et des Matériaux d'Orsay (ICMMO), Université Paris-Saclay, CNRS Bât. 410 91405 Orsay France nadezhda.shchedrina@universite-paris-saclay.fr.
Abstract:
This study explores the structural transformations induced by femtosecond (fs) laser inscriptions in glass, with a focus on type II modifications (so-called nanogratings), crucial for advanced optical and photonic technologies. Our novel approach employs scattering-type scanning near-field optical microscopy (s-SNOM) and synchrotron radiation nanoscale Fourier-transform infrared spectroscopy (nano-FTIR) to directly assess the nanoscale structural changes in the laser tracks, potentially offering a comprehensive understanding of the underlying densification mechanisms. The results reveal the first direct nanoscale evidence of densification driven by HP-HT within fs-laser inscribed tracks, characterized by a significant shift of the main infrared (IR) vibrational structural band of silica glass. It reveals moreover a complex interplay between type I and type II modifications.

