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Frontier system-on-chip (SoC) technology for microwave diagnostics (invited)
Ying Chen1, Pin-Jung Chen1, Robert Hu2
1University of California, Davis, California 95616, USA.
The Review of Scientific Instruments
|September 10, 2024
Summary
System-on-chip (SoC) technology advances microwave diagnostics for fusion energy. This innovation enables smaller, more reliable systems, crucial for next-generation fusion power plants and improving plasma measurements.
Area of Science:
- Nuclear Fusion Engineering
- Applied Microwave Engineering
- Plasma Diagnostics
Background:
- Next-generation fusion reactors require advanced diagnostic systems to prove electricity generation viability.
- Increased neutron flux in future reactors necessitates reduced vessel penetrations and elimination of internal diagnostics.
- Existing microwave diagnostics face challenges due to space and reliability constraints in harsh fusion environments.
Purpose of the Study:
- To develop miniaturized, modular, and reliable microwave diagnostic systems for fusion reactors using System-on-Chip (SoC) technology.
- To demonstrate the practical application and effectiveness of SoC-based microwave diagnostics in operational fusion devices.
- To advance higher frequency capabilities for fusion diagnostics through novel SoC development.
Main Methods:
- Pioneered a seven-year research effort culminating in the V- and W-band system-on-chip (SoC) approach.
- Developed and implemented active transmitter and passive receiver SoC modules in the DIII-D tokamak.
- Utilized arrays of SoC modules to support microwave imaging diagnostics and Electron Cyclotron Emission Imaging.
- Achieved breakthrough development of an F-band SoC for higher frequency applications.
Main Results:
- Successfully deployed V- and W-band SoC modules in the DIII-D tokamak, supporting microwave imaging diagnostics.
- Electron Cyclotron Emission Imaging system on DIII-D provided new physics measurement results, demonstrating improved diagnostic capabilities.
- Developed a novel F-band SoC, extending frequency range for future fusion device diagnostics.
Conclusions:
- System-on-Chip (SoC) technology significantly enhances the reliability, miniaturization, and integration of microwave diagnostic systems for fusion energy.
- The developed SoC-based diagnostics have proven effective in practical applications, improving plasma measurements in fusion devices like DIII-D.
- These advancements represent a substantial step towards reliable and efficient plasma diagnostics essential for future fusion power plants.

