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Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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Atomic Emission Spectroscopy: Lab01:29

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Echo01:06

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The human ear cannot distinguish between two sources of sound if they happen to reach within a specific time interval, typically 0.1 seconds apart. More than this, and they are perceived as separate sources.
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Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

175
In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

346
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Related Experiment Video

Updated: Jun 13, 2025

Evaluating Targeting Accuracy in the Focal Plane for an Ultrasound-guided High-intensity Focused Ultrasound Phased-array System
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Experimental and Numerical Investigation of Acoustic Emission Source Localization Using an Enhanced Guided Wave

Jiaying Sun1, Zexing Yu1, Chao Xu1,2

  • 1School of Astronautics, Northwestern Polytechnical University, Xi'an 710072, China.

Sensors (Basel, Switzerland)
|September 14, 2024
PubMed
Summary

This study introduces a new acoustic emission (AE) localization method using a dense sensor array. The enhanced phased array accurately detects damage in structures without needing pre-defined wave speeds.

Keywords:
acoustic emissionautomatic wave velocity calculationguided wave phased arraysource localizationstructural health monitoring

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Area of Science:

  • Mechanical Engineering
  • Materials Science
  • Non-Destructive Testing

Background:

  • Acoustic emission (AE) inspection is vital for detecting damage in mechanical structures.
  • Classical AE methods with sparse sensors struggle with localization accuracy in complex structures due to reliance on pre-defined wave velocities.

Purpose of the Study:

  • To enhance AE source localization accuracy in aluminum thin plates using a passive guided wave phased array method.
  • To develop a method that does not require prior knowledge of wave velocity for accurate damage detection.

Main Methods:

  • Utilized a cross-shaped phased array enhanced with four additional far-end sensors for AE source localization.
  • Implemented a two-step approach: real-time velocity and polar angle calculation via phased array, followed by source location determination using far-end sensors.
  • Validated the method through numerical simulations and physical experiments on aluminum flat panels and stiffened thin-walled structures.

Main Results:

  • The proposed cross-shaped guided wave phased array method with enhanced sensors accurately localized AE sources without prior wave velocity information.
  • Achieved high localization accuracy on both simple aluminum plates and complex stiffened thin-walled structures.
  • Investigated the impact of phased array element count and time window length on localization performance.

Conclusions:

  • The passive guided wave phased array method offers superior AE source localization accuracy compared to traditional sparse array techniques.
  • The method is robust and applicable to complicated mechanical structures, improving damage detection capabilities.
  • Further analysis provides insights into optimizing the phased array configuration for specific applications.