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Updated: Jun 12, 2025

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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Surface sensitivity of atomic-resolution secondary electron imaging.

Koh Saitoh1, Teppei Oyobe2, Keisuke Igarashi3

  • 1Institute of Materials and Systems for Sustainability, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.

Microscopy (Oxford, England)
|September 20, 2024
PubMed
Summary
This summary is machine-generated.

High-resolution secondary electron (SE) imaging reveals surface monolayers in twisted molybdenum disulfide (MoS2) bilayers. The surface layer emits SEs three times more intensely than the second layer due to electron attenuation.

Keywords:
atomic layer materialsatomic-resolution scanning electron microscopysecondary electron imagingsurface sensitivity

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Area of Science:

  • Materials Science
  • Surface Science
  • Electron Microscopy

Background:

  • High-resolution secondary electron (SE) imaging is a crucial technique for surface analysis.
  • Understanding the surface sensitivity of SE imaging is vital for accurate material characterization.
  • Molybdenum disulfide (MoS2) is a significant two-dimensional material with diverse electronic properties.

Purpose of the Study:

  • To investigate the surface sensitivity of high-resolution SE imaging.
  • To elucidate the structural and electronic properties of twisted MoS2 bilayers using SE imaging.
  • To quantify the difference in SE yields between surface and subsurface layers in MoS2 bilayers.

Main Methods:

  • Fabrication of twisted bilayers of MoS2 stacked at a 30° angle.
  • High-resolution secondary electron (SE) imaging to visualize atomic structures.
  • Annular dark-field scanning transmission electron microscopy (ADF-STEM) for cross-sectional analysis.

Main Results:

  • SE images clearly depicted a honeycomb structure of Mo and S atoms, confirming the monolayer nature of the surface MoS2.
  • ADF-STEM images revealed the projected structure of both layers in the twisted bilayer.
  • SE yields from the surface monolayer were approximately three times higher than those from the second monolayer.

Conclusions:

  • High-resolution SE imaging selectively visualizes the surface monolayer in twisted MoS2 bilayers.
  • The observed difference in SE yields is attributed to the attenuation of secondary electrons traversing the surface layer.
  • This study confirms the surface sensitivity of high-resolution SE imaging for characterizing layered 2D materials.