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Polymerizable Nonionic Perfluorinated Photoacid Generators for High-Resolution Lithography.
Yue Liu1, Dong Wang1, Qianqian Wang1
1National Engineering Research Center for Colloidal Materials, School of Chemistry and Chemical Engineering, Shandong University, 27 South Shanda Road, Ji'nan, Shandong, 250100, China.
Small Methods
|September 23, 2024
Summary
New fluorine-rich photoacid generators (PAGs) overcome resolution and sensitivity trade-offs in advanced photoresists. These novel PAGs minimize acid diffusion, enabling high-resolution nano-patterning for next-generation lithography.
Area of Science:
- Materials Science
- Chemistry
- Nanotechnology
Background:
- Chemically amplified photoresists face challenges with acid diffusion, limiting resolution, line-edge roughness, and sensitivity.
- Achieving high-resolution lithography requires overcoming the trade-off between these critical parameters.
Purpose of the Study:
- To develop novel photoacid generators (PAGs) that enhance sensitivity and minimize acid diffusion for advanced lithography.
- To synthesize PAG-bound polymers for improved resolution in nano-patterning.
Main Methods:
- Development of alkene-functionalized nonionic perfluorinated photoacid generators (PAGs).
- Synthesis of polymerizable PAG monomers and PAG-bound polymers.
- Evaluation of lithography performance, including sub-45 nm line patterning.
Main Results:
- Fluorine-rich PAGs exhibit enhanced photochemical reactivity, improving photoresist sensitivity.
- Generated sulfonic acids have large sizes and minimal diffusion, effectively suppressing acid diffusion.
- Sub-45 nm lines were patterned at an electron beam dose of 29 µC cm⁻² using PAG-bound polymer photoresists.
Conclusions:
- The developed perfluorinated PAGs offer a promising solution for high-sensitivity and high-resolution nano-patterning.
- PAG-bound polymers further enhance resolution by minimizing acid diffusion.
- These materials are suitable for advanced lithography applications requiring stringent performance metrics.
Keywords:
PAG‐bound polymersacid diffusionchemically amplified resistperfluorinated nonionic PAGphotolithography
