Metallic Solids
Valence Bond Theory
Properties of Transition Metals
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Xianghong Xue1, Zhihua Lin2, Rui Gao2
1School of Automation and Information Engineering, Xi'an University of Technology, Xi'an 710048, People's Republic of China.
This study explores new two-dimensional topological insulators (TIs) with larger bandgaps for spintronics and quantum computing. Functionalized III-V monolayers show promise for room-temperature applications.
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