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On the temporal transfer function in STEM imaging from finite detector response time.

Jonathan J P Peters1, Tiarnan Mullarkey2, Julie Marie Bekkevold1

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Summary
This summary is machine-generated.

Faster scanning transmission electron microscopy requires accounting for detector response times. We introduce a temporal transfer function (TTF) to model and simulate these effects, improving image quality in high-speed electron microscopy.

Keywords:
High-speed imagingLow-dose imagingSTEM detectorsScanning transmission electron microscopy (STEM)

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Area of Science:

  • Materials Science
  • Physics
  • Electron Microscopy

Background:

  • Faster scanning in electron microscopy is crucial for dose control, minimizing environmental distortions, and capturing dynamic in-situ experiments.
  • Recent advances enable pixel dwell times in the nanosecond range, necessitating consideration of detector response limitations.

Purpose of the Study:

  • To address the blurring effects caused by finite electron detector response times during high-speed scanning.
  • To introduce a method for modeling and simulating these detector response effects in scanning transmission electron microscopy (STEM).

Main Methods:

  • Development of a temporal transfer function (TTF) to characterize detector response.
  • Integration of the TTF into a simulation framework to model imaging artifacts.

Main Results:

  • The TTF accurately describes how detector response time blurs image features at high scan speeds.
  • The proposed simulation framework can predict and compensate for these blurring effects.

Conclusions:

  • Understanding and modeling detector response time is essential for high-quality imaging in fast scanning electron microscopy.
  • The developed TTF and simulation framework offer a pathway to mitigate artifacts and improve image fidelity in dynamic STEM experiments.