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This study introduces a novel ultrafast electron diffraction (UED) instrument with high repetition rates and direct electron detection. This advancement enables more sensitive investigations of ultrafast dynamics in photoexcited samples.

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Area of Science:

  • Physics
  • Materials Science
  • Chemistry

Background:

  • Traditional ultrafast electron diffraction (UED) instruments operate at low repetition rates (kHz or lower).
  • These instruments rely on indirect electron detection, necessitating electron beams with many electrons per pulse (≫100).
  • High electron counts per pulse cause space-charge effects, leading to long electron pulse durations and large transverse diameters, limiting experimental resolution.

Purpose of the Study:

  • To develop and demonstrate a novel UED instrument operating at a high repetition rate (30 kHz).
  • To implement direct electron detection in UED experiments.
  • To overcome limitations imposed by space-charge effects in traditional UED.

Main Methods:

  • Utilized a novel UED instrument with a 30 kHz repetition rate.
  • Employed electron beams with 1-140 electrons per pulse, operating below the severe space-charge regime.
  • Implemented direct electron detection for enhanced sensitivity.

Main Results:

  • Successfully detected time-resolved signals from thin film solid samples.
  • Achieved a difference contrast signal as low as 10-5.
  • Obtained an instrument response function of 184 fs (FWHM) without temporal compression.

Conclusions:

  • Increasing the repetition rate and adopting direct electron detection are crucial for advancing UED experiments.
  • The developed scheme enables more efficient and sensitive investigations of ultrafast dynamics.
  • This approach is particularly impactful for gas-phase UED and the study of photoexcited samples.