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Development of a Topological-Insulator-Based Quantum Resistance Standard

Ngoc Thanh Mai Tran1,2, Linsey K Rodenbach3, Jason M Underwood1

  • 1National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA.

IEEE Transactions on Instrumentation and Measurement
|October 9, 2024
PubMed

Keywords:
electrical resistance measurementmeasurement standardsprecision measurementstopological insulators

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