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Updated: Jun 11, 2025

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Yi Gao1, Zhensong Li2, Yutong Wang1
1Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science and Technology University, Beijing, 100192, China.
This study introduces an improved YOLOv5 model for printed circuit board (PCB) defect detection, enhancing accuracy and efficiency for small defects. The new method significantly reduces model size and computational cost while improving defect identification capabilities.
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