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Updated: Jun 11, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
New tunneling source follower with low 1/f noise and high voltage gain
Ki Yeong Kim1, Hyangwoo Kim2, Minkeun Choi1
1Department of Convergence IT Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 37673, South Korea.
Abstract:
We have designed a tunneling source follower (TSF) for image sensors that achieves high voltage gain (Av) and low 1/f noise simultaneously. The TSF is composed of N-P-N-N, especially the p-doped grounded area, which serves to amplify the insufficient tunneling current, allowing the source follower (SF) to utilize band-to-band tunneling (BTBT). Compared to thermionic emission, tunneling based structures contribute to increasing Av through lower channel length modulation and lower body effect. As a result, TSF achieves a higher Av (~ 1.0 V/V) than conventional SF (~ 0.9 V/V). Moreover, the n-doped channel makes the buried conductive channel farther from the interface, lowering the noise. The input-referred voltage noise spectral density (SV) is approximately 10 times lower in TSF than that of in conventional SF. Therefore, our TSF can be a possible candidate for High Av and low 1/f noise image sensors.
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