Related Experiment Video
Updated: Jun 27, 2026

Fabrication of Flexible Image Sensor Based on Lateral NIPIN Phototransistors
Published on: June 23, 2018
Wafer-scale integration of two-dimensional perovskite oxides towards motion recognition
Ming Deng1, Ziqing Li2, Shiyuan Liu3
1Department of Materials Science and State Key Laboratory of Molecular Engineering of Polymers, Fudan University, Shanghai, P. R. China.
Abstract:
Two-dimensional semiconductors have shown great potential for the development of advanced intelligent optoelectronic systems. Among them, two-dimensional perovskite oxides with compelling optoelectronic performance have been thriving in high-performance photodetection. However, harsh synthesis and defect chemistry severely limit their overall performance and further large-scale heterogeneous integration. Here, we report the wafer-scale integration of highly oriented nanosheets by introducing a charge-assisted oriented assembly film-formation process and confirm its universality and scalability. The shallow-trap dominance induced by structural optimization endows the device with a distinguished performance balance, including high photosensitivity close to that of single nanosheet units and fast response speed. An integrated ultra-flexible 256-pixel device demonstrates the versatility of material-to-substrate integration and conformal imaging functionality. Moreover, the device achieves efficient recognition of multidirectional motion trajectories with an accuracy of over 99.8%. Our work provides prescient insights into the large-area fabrication and utilization of 2D perovskite oxides in advanced optoelectronics.
Related Concept Videos
Relative Motion Analysis using Rotating Axes
However, to express the relative position of point B relative to point A, an additional frame of reference, denoted as x'y', is necessary. This additional frame not only translates but also rotates relative to the fixed frame, making it instrumental in...
Relative Motion Analysis using Rotating Axes-Problem Solving
Here, in order to determine the magnitude of velocity and acceleration for point...

