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Published on: May 17, 2024
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J Kirsch1,2, Joshua Martin1, Ronald Warzoha3
1Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Frequency Domain Thermoreflectance (FDTR) provides a practical guide to building and using FDTR instruments for accurate thermal property measurements in microelectronics. This resource enhances the accessibility and adoption of this crucial thermal analysis technique.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Nanotechnology
Background:
- Frequency Domain Thermoreflectance (FDTR) is vital for measuring thermal properties of nanoscale materials relevant to microelectronics.
- Accurate thermal management in shrinking electronic components relies on understanding thermal transport at small length scales.
- Current FDTR instruments are often custom-built, posing challenges in construction, alignment, and maintenance for researchers.
Purpose of the Study:
- To provide a practical guide for constructing, aligning, and maintaining FDTR instrumentation.
- To increase the accessibility, replicability, and widespread adoption of FDTR for thermal property measurements.
- To share unpublished insights and institutional knowledge for accurate and repeatable FDTR measurements.
Main Methods:
- Detailed discussion of component selection, placement, and alignment procedures for FDTR instruments.
- Exploration of data collection parameters, common challenges, and automation efforts in FDTR measurements.
- Comparison of numerical integration methods and fitting approaches (e.g., Monte Carlo simulation) for data analysis and uncertainty quantification.
Main Results:
- The study offers practical, unpublished insights crucial for obtaining reliable thermal property measurements using FDTR.
- Comparative analysis demonstrates the reliability and relative speed of different data fitting and uncertainty analysis methods.
- The FDTR instrument was validated using substrates with known thermal properties, including silica, quartz, sapphire, and silicon.
Conclusions:
- This work serves as a practical resource to demystify FDTR instrumentation and improve measurement accuracy.
- The provided guidance and analysis methods facilitate broader adoption and reliable application of FDTR in thermal property characterization.
- The validated instrument and shared knowledge contribute to advancing thermal management solutions in microelectronics.
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