Related Experiment Video
Updated: Jun 10, 2025

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Observation of the decay
, A Hayrapetyan1, A Tumasyan1,2
1Yerevan Physics Institute, Yerevan, Armenia.
Abstract:
Using proton-proton collision data corresponding to an integrated luminosity of collected by the CMS experiment at , the decay is observed for the first time, with a statistical significance exceeding 5 standard deviations. The relative branching fraction, with respect to the decay, is measured to be , where the first uncertainty is statistical, the second is systematic, and the third is related to the uncertainties in and .
Related Concept Videos
Radioactive Decay and Radiometric Dating
Interference and Decay
Interference occurs when competing memories hinder the retrieval of particular information. It can be classified into two types: proactive and retroactive interference. Proactive...
¹³C NMR: ¹H–¹³C Decoupling
A broadband decoupling technique is used to simplify these complex, sometimes overlapping, signals. Broadband decoupling relies on a...
The de Broglie Wavelength
Positron Emission Tomography
One of the main requirements of a PET scan is a positron-emitting radioisotope, which is produced in a cyclotron and then attached to a substance used by the part of the body...

