Near-field millimeter-wave and visible image fusion via transfer learning

Ming Ye1, Yitong Li1, Di Wu1

  • 1School of Automation Engineering, University of Electronic Science and Technology of China, Xiyuan street 2006, Chengdu, 611731, Sichuan, China.

Summary

A new deep learning strategy fuses millimeter wave (mmWave) and visible images for enhanced internal defect detection in obstructed environments. This approach improves accuracy and robustness for real-world penetrating imaging applications.

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