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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
Zeyu Shu1, Jian He1, Muping Hu1
1College of Aerospace and Civil Engineering, Harbin Engineering University, Harbin 150001, China.
This study introduces a new probabilistic method for Lamb wave damage localization, reducing the need for extensive sensor data and baseline signals. The probabilistic exchanging-element time-reversal method (PEX-TRM) enhances damage identification efficiency.
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