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Updated: Jun 9, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Liguo Tian1, Lanjiao Liu2, Zihe Liu2
1International Research Centre for Nano Handing and Manufacturing of China, Changchun University of Science and Technology, Changchun 130012, China; Zhongshan Institute of Changchun University of Science and Technology, Zhongshan 528400, China.
This study introduces an optimized homography matrix method for atomic force microscopy (AFM) image stitching. The technique effectively reduces noise and enhances image geometric consistency and detail preservation.
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