Developing Correction Methods by Revisiting the Concept of Effective Thickness in Attenuated Total Reflection

Thomas G Mayerhöfer1,2, Jürgen Popp1,2

  • 1Spectroscopy and Imaging, Leibniz Institute of Photonic Technology (IPHT), Jena, Germany.

Applied Spectroscopy
|October 29, 2024
PubMed
Summary

This study presents a refined method for calculating effective thickness in attenuated total reflection (ATR) spectroscopy, improving accuracy for organic and biological samples. The new approach enhances ATR correction schemes and aids spectral analysis.

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