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Updated: Jun 9, 2025

Tuning Oxide Properties by Oxygen Vacancy Control During Growth and Annealing
Published on: June 9, 2023
Junichi Nomoto1, Takashi Koida2, Iwao Yamaguchi1
1Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan.
Optimizing sputtering conditions like water vapor partial pressure, RF power, and oxygen flow is key to creating high-quality hydrogen-doped indium oxide films with excellent conductivity and transparency.
08:23Niobium Oxide Films Deposited by Reactive Sputtering: Effect of Oxygen Flow Rate
Published on: September 28, 2019
12:05U2O5 Film Preparation via UO2 Deposition by Direct Current Sputtering and Successive Oxidation and Reduction with Atomic Oxygen and Atomic Hydrogen
Published on: February 21, 2019
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