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Updated: Jun 9, 2025

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Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy
Akhil Tayal1, David Scott Coburn1, Donald Abel1
1National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA.
A new hard X-ray spectrometer at the National Synchrotron Light Source II (NSLS-II) offers high-resolution analysis for materials science. Its innovative data acquisition enhances experimental efficiency for diverse scientific applications.
Area of Science:
- Materials Science
- Atomic and Molecular Physics
- Chemistry
Background:
- Inner shell spectroscopy provides critical data on electronic and geometric structures.
- Advanced instrumentation is needed to achieve higher resolution and efficiency in X-ray analysis.
Purpose of the Study:
- To present a newly commissioned five-analyzer Johann spectrometer at the National Synchrotron Light Source II (NSLS-II).
- To detail the design, alignment, and data acquisition of this hard X-ray photon-in/photon-out spectrometer.
Main Methods:
- Commissioning of a five-analyzer Johann spectrometer at the 8-ID beamline.
- Implementation of a continuous asynchronous data-acquisition scheme.
- Characterization of the spectrometer's performance for hard X-ray spectroscopy.
Main Results:
- The spectrometer achieves a resolution of 0.5–2 eV for hard X-ray photon-in/photon-out spectroscopy.
- The continuous asynchronous data acquisition significantly enhances experimental efficiency.
- The instrument provides detailed insights into the local electronic and geometric structure of materials.
Conclusions:
- The new spectrometer is a valuable tool for a diverse user community across physical, chemical, biological, environmental, and materials sciences.
- The developed data acquisition method represents a significant advancement in experimental efficiency for X-ray spectroscopy.
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