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Exponential Wiener index of some silicate networks
G Subashini1, K Kannan2, A Menaga3
1Department of Mathematics, Srinivasa Ramanujan Centre, SASTRA Deemed to be University, Kumbakonam, Tamil Nadu, 612001 , India.
Scientific Reports
|November 8, 2024
Summary
Researchers defined a new exponential Wiener index for silicate structures. This molecular descriptor aids in understanding silicon-based materials crucial for microchips and electronic devices.
Area of Science:
- Chemistry
- Materials Science
- Graph Theory
Background:
- Topological graph indices, or molecular descriptors, quantify molecular structure for property analysis.
- Silicon and its compounds, silicates, are vital for microelectronics (e.g., PDAs, PCs).
- Understanding silicate properties is key for advancing real-time applications.
Purpose of the Study:
- To introduce and define a novel topological index, the exponential Wiener index.
- To extend this index to include line graphs of silicate molecular structures.
- To compute and analyze this index for specific silicate types.
Main Methods:
- Grouping molecular graph vertices by distance sums to derive the index.
- Applying the exponential Wiener index to cyclic, single-chain, and Pyro silicates.
- Calculating the index for molecular graphs and their line graphs with n=3, 4, 5 vertices.
Main Results:
- The exponential Wiener index was successfully determined for various silicate structures.
- Numerical values for the exponential Wiener index and multiplicative exponential Wiener index were computed.
- The study explored these indices for both original and line graphs of silicates.
Conclusions:
- The exponential Wiener index provides a new tool for analyzing silicate molecular structures.
- This descriptor can offer insights into the physical properties of silicon-based materials.
- The findings contribute to the mathematical characterization of silicates for potential applications.
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