Electrochemical Migration Study on Sn-58Bi Lead-Free Solder Alloy Under Dust Contamination

Fuye Lu1, Han Sun1, Wenlong Yang1

  • 1School of Materials Science and Engineering, Dalian University of Technology, Dalian 116000, China.

PubMed
Summary

Sn-58Bi solder resists electrochemical migration (ECM) better in NaCl than Na2SO4 solutions. Dust contaminants like NaCl and Na2SO4 accelerate ECM failure in miniaturized electronics.