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Electrochemical Migration Study on Sn-58Bi Lead-Free Solder Alloy Under Dust Contamination
Fuye Lu1, Han Sun1, Wenlong Yang1
1School of Materials Science and Engineering, Dalian University of Technology, Dalian 116000, China.
Sn-58Bi solder resists electrochemical migration (ECM) better in NaCl than Na2SO4 solutions. Dust contaminants like NaCl and Na2SO4 accelerate ECM failure in miniaturized electronics.
Area of Science:
- Materials Science
- Electrochemistry
- Reliability Engineering
Background:
- Electronic packaging miniaturization increases susceptibility to electrochemical migration (ECM) due to high-density electric fields, moisture, and contaminants.
- Air pollution introduces dust, a significant factor in ECM, containing soluble salts like NaCl and Na2SO4.
- Understanding ECM failure mechanisms in solder joints under dust-induced contamination is crucial for reliable electronic devices.
Purpose of the Study:
- To investigate the electrochemical migration failure mechanism of Sn-58Bi solder joints exposed to NaCl and Na2SO4 solutions, simulating soluble salts in dust.
- To compare the ECM resistance of Sn-58Bi solder in NaCl versus Na2SO4 solutions.
- To analyze the composition of dendrites formed during ECM and evaluate the solder's corrosion resistance.
Main Methods:
- Utilized a water-droplet experimental method to analyze ECM failure in Sn-58Bi solder joints.
- Simulated soluble salt contaminants using 0.2 mM/L NaCl and Na2SO4 solutions.
- Employed X-ray Photoelectron Spectroscopy (XPS) to analyze dendrite composition and polarization tests to determine corrosion potential.
Main Results:
- Sn-58Bi solder exhibited a longer mean failure time in NaCl (53 s) compared to Na2SO4 (32 s).
- XPS analysis identified dendrites composed mainly of Sn, SnO, and SnO2, with Sn(OH)2 and Na2SO4 precipitates.
- Polarization tests showed a higher corrosion potential in NaCl (-0.351 V) than in Na2SO4 (-0.360 V), indicating better corrosion resistance in NaCl.
Conclusions:
- Sn-58Bi solder demonstrates superior resistance to electrochemical migration in NaCl solutions compared to Na2SO4 solutions.
- The difference in anodic dissolution characteristics between NaCl and Na2SO4 significantly impacts ECM failure times.
- Soluble salts in dust pose a considerable risk to the reliability of electronic packaging, with varying impacts depending on the salt composition.
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