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Imaging Biological Samples with Optical Microscopy01:18

Imaging Biological Samples with Optical Microscopy

Optical microscopy uses optic principles to provide detailed images of samples. Antonie van Leeuwenhoek designed the first compound optical microscope in the 17th century to visualize blood cells, bacteria, and yeast cells. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes with enhanced magnification and resolution.
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Method for Extracting Optical Element Information Using Optical Coherence Tomography.

Jiucheng Nie1,2,3,4, Yukun Wang1,2,3,4, Dacheng Wang1,2,3,4

  • 1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China.

Sensors (Basel, Switzerland)
|November 9, 2024
PubMed
Summary
This summary is machine-generated.

This study introduces a novel method for simultaneously measuring optical film thickness, curvature, and defects using spectral-domain optical coherence tomography (SD-OCT). This advancement improves optical element quality testing with high accuracy and efficiency.

Keywords:
curvature measurementmultilayer filmspectral-domain OCTthickness measurement

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Area of Science:

  • Optical Engineering
  • Metrology
  • Non-destructive Testing

Background:

  • Accurate measurement of optical film parameters (thickness, curvature, defects) is crucial for quality control.
  • Existing methods struggle to simultaneously extract these multiple parameters.
  • Spectral-domain optical coherence tomography (SD-OCT) offers non-invasive imaging for optical element analysis.

Purpose of the Study:

  • To develop and validate a highly accurate and efficient method for simultaneous measurement of film thickness, curvature, and defects.
  • To enhance the capabilities of SD-OCT for optical thin film metrology.
  • To improve the quality and performance testing of optical elements.

Main Methods:

  • Proposed an error correction model for SD-OCT to compensate for delay differences, field curvature, and aberrations.
  • Implemented histogram-equalized gray stretching (IAH-GS) for handling strong reflections in thin films.
  • Developed a window threshold cutoff algorithm for accurate defect and boundary identification in OCT images.

Main Results:

  • Achieved simultaneous measurement of thickness, curvature, and defects in optical films.
  • Demonstrated a thickness measurement accuracy of 1.924 µm.
  • Maintained a difference within 1% between calibrated and nominal curvature measurements.
  • System capabilities include a 4.508 mm measurement depth and 5.69 µm resolution.

Conclusions:

  • The proposed SD-OCT method enables simultaneous, accurate, and efficient measurement of optical film thickness, curvature, and defects.
  • This technique significantly advances optical thin film testing, improving productivity and product quality.
  • The error correction model and algorithms enhance the reliability and applicability of SD-OCT in optical metrology.