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Research on the OFDR strain measurement method based on similarity features of dual-segment RSS
Optics Express
|November 14, 2024
Summary
This study introduces a novel optical frequency domain reflectometry (OFDR) method to improve strain measurement accuracy. The technique enhances signal similarity for precise deformation analysis in aerospace and bridge monitoring applications.
Area of Science:
- Fiber Optic Sensing Technology
- Optical Measurement Techniques
- Materials Science and Engineering
Background:
- Optical frequency domain reflectometry (OFDR) is a key technology for fiber optic sensing, enabling strain, vibration, and temperature measurements.
- Applications include deformation analysis of aerospace components and structural health monitoring of bridges.
- Large strains can cause significant demodulation errors due to reduced signal similarity.
Purpose of the Study:
- To analyze the causes of strain demodulation errors under large strain conditions.
- To propose a new strain measurement method addressing signal similarity issues in OFDR.
- To develop an optimized strain edge demodulation technique for enhanced accuracy.
Main Methods:
- A strain measurement method utilizing the similarity feature of a double-segment Rayleigh scattering spectrum was developed.
- Local segments of the reference signal were used as fingerprint spectra for similarity matching.
- A strain edge optimization method with automatic sliding window center adjustment was implemented.
Main Results:
- The proposed method demonstrated improved strain measurement accuracy compared to traditional techniques.
- A sensing unit length of 32.6 mm and a frequency modulation bandwidth of 5 nm were achieved.
- The measurement range extended to ±2000 µɛ to ±2500 µɛ, with measurable spectral offset increasing from 48% to 60% and a maximum standard deviation of 1.9 µɛ.
Conclusions:
- The novel OFDR strain measurement method effectively reduces demodulation errors under large strains.
- The technique offers enhanced precision and a wider measurement range for critical structural monitoring.
- This advancement holds significant potential for applications requiring high-accuracy deformation analysis.

