A Tutorial on Instrumental Parameters in Pulsed Force Kelvin Probe Force Microscopy

For the creation of smaller and smaller electrical devices and fundamental studies, Kelvin Probe Force Microscopy (KPFM) offers a technique that measures the surface potential with nanometer lateral resolution and allows for a more precise understanding of properties such as the work function, the localization of charges and the doping of materials. Despite its obvious potential, the complexity of its implementation is currently a bottleneck for its extensive application. Here, we introduce a step-by-step overview of the different experimental parameters that need to be controlled in PF-KPFM to ensure their useful effect on the measured contact potential difference.