Repetitive ultramicrotome trimming and SEM imaging for characterizing printed multilayer structures

Area of Science:

• Materials Science
• Microscopy
• Nanotechnology

Background:

• Ultramicrotomy is a standard technique for preparing thin sections for microscopy in biology and medicine.
• Its application in materials science for sample preparation is emerging.
• Inkjet-printed multilayer structures present challenges for characterization due to their complex morphology.

Purpose of the Study:

• To demonstrate an efficient ultramicrotomy method for cross-section preparation of inkjet-printed multilayer devices.
• To enable precise, repetitive sample preparation at well-defined positions.
• To facilitate detailed 3D analysis of printed multilayer structures.

Main Methods:

• Utilized ultramicrotomy for repetitive cross-section preparation of a three-layer capacitor device.
• Employed a scanning electron microscope for imaging the prepared cross-sections.
• Developed custom-modified ultramicrotome and scanning electron microscope specimen holders for accurate sample transfer.

Main Results:

• Demonstrated the feasibility of using ultramicrotomy for preparing cross-sections of inkjet-printed multilayer structures.
• Achieved repetitive cross-sectioning at well-defined positions within the sample volume.
• Enabled high-accuracy transfer of samples between instruments without damage.

Conclusions:

• The developed ultramicrotomy method offers an efficient alternative to traditional techniques like argon ion beam milling.
• This approach enhances the combined use of ultramicrotomy and scanning electron microscopy for investigating printed multilayer structures.
• Provides a pathway for comprehensive understanding and optimization of device architecture and printing processes.