Advances and challenges in dynamic photo-induced force microscopy

Area of Science:

• Nanoscience and Spectroscopy
• Scanning Probe Microscopy

Background:

• Photo-induced force microscopy (PiFM) is a scanning probe technique for high-resolution nanoscale imaging.
• It utilizes photo-induced forces, influenced by local medium responses (dipole, thermal), to amplify tip motion.
• Understanding the interplay of far-field and near-field effects is crucial for interpreting spectroscopic origins.

Purpose of the Study:

• To provide a comprehensive review of existing research in Photo-induced force microscopy (PiFM).
• To elucidate the technical intricacies and theoretical foundations of PiFM.
• To explore the distinct photo-induced dipole force and photo-induced thermal force mechanisms within PiFM.

Main Methods:

• Review of prior research and technical methodologies in Photo-induced force microscopy (PiFM).
• Analysis of dynamic PiFM modes associated with dipole and thermal force interactions.
• Discussion of theoretical principles and practical demonstrations for a broad audience.

Main Results:

• Detailed examination of how photo-induced forces, both dipole and thermal, drive nanoscale imaging in PiFM.
• Exploration of the complex force response behaviors influenced by local optical properties.
• Identification of dynamic PiFM modes relevant to different spectroscopic origins.

Conclusions:

• Photo-induced force microscopy (PiFM) is a powerful tool for nanoscale spectroscopic imaging.
• This review offers foundational knowledge and advanced insights for researchers entering the field.
• Understanding the underlying force mechanisms is key to leveraging PiFM's full potential.