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Related Experiment Videos

Electronic image formation in high-voltage TEM by sequential pixel acquisition.

M Fotino

    Journal of Microscopy
    |February 1, 1986
    PubMed
    Summary
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    A new hybrid imaging system enables electronic manipulation of high-voltage transmission electron microscopy (TEM) images. This system dissects images into pixels for advanced analysis, including mass and energy-loss measurements.

    Area of Science:

    • Materials Science
    • Electron Microscopy
    • Physics

    Background:

    • High-voltage transmission electron microscopy (TEM) is crucial for materials analysis.
    • Current methods for image manipulation and data acquisition can be complex and limited.
    • A need exists for more direct electronic control and quantitative analysis of TEM images.

    Purpose of the Study:

    • To introduce a novel hybrid imaging system for electronic detection and manipulation of high-voltage TEM images.
    • To demonstrate the system's capability for pixel-by-pixel image dissection and analysis.
    • To explore applications in quantitative measurements and energy-loss spectroscopy.

    Main Methods:

    • Integration of a two-dimensional beam deflector for raster scanning.
    • Sequential pixel acquisition using an electron detector and aperture.

    Related Experiment Videos

  • Display of acquired images and intensity profiles on a Cathode Ray Tube (CRT).
  • Utilizing a magnetic prism for diffraction pattern manipulation and energy filtering.

    • Main Results:

    • The system successfully dissects TEM images into electronically controlled pixels.
    • Quantitative absorption or thickness profiles were obtained via Y-modulation of scanned pixel intensity.
    • Individual diffraction spot intensities were quantitated over a wide dynamic range.
    • Demonstrated potential for local mass measurements and energy-loss analysis.

    Conclusions:

    • The developed hybrid imaging system offers a versatile platform for advanced TEM image analysis.
    • Electronic pixel manipulation simplifies quantitative measurements and opens new avenues for materials characterization.
    • The system provides an alternative to complex electron-optical systems for energy filtering and analysis.