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Updated: Jun 6, 2025

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Ambipolar Seebeck Coefficient in MoS2/MoS2-MoO2 Graded Composites by Junction Reciprocation
Abinaya Rengarajan1,2, Mohamed Jibri Khaja Peer1,2, Harish Santhana Krishnan1,2
1Center of Excellence in Materials and Advanced Technologies (CeMAT), Faculty of Engineering and Technology, SRM institute of Science and Technology, Kattankulathur 603 203, India.
Abstract:
We fabricated radially transformed growth of MoS2 to MoS2-MoO2 by the two-zone chemical vapor transport (CVT) technique. The idea to apply heat, i.e., hot junction (T), on both the edges of the film has a distinct ambipolar Seebeck coefficient (S) of -20 μVK-1 with MoS2 as hot junction, and 69.5 μVK-1 with MoS2-MoO2 as hot junction. The positive S at MoS2-MoO2 indicates fast hole injection at a lower degree of interface Fermi-level pinning and large asymmetry at the junctions through low energy carrier scattering in the multiple potential barriers at the interfaces of each region. The decreased Θ around 5 K than MoS2 reveals the lattice softening due to reduced strength of chemical bonding at MoS2-MoO2. The report propounds the potential utilization of multiple potential barriers for thin film graded composites in thermoelectric applications.
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