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Updated: Jun 5, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Ankita Sharma1,2, John N Straguzzi1, Tianyuan Xue1,2
1Max Planck Institute of Microstructure Physics, Halle (Saale), Germany.
We developed a heuristic optimization method to improve single-lobe emission in optical phased arrays (OPAs). This technique corrects for optical non-idealities, enhancing beam quality for alias-free out-of-plane emission applications.
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